Export Citation

Export to :

Citation :

Language:
Style:
Jeong-In Kim, Ji-Soo Kim, Young-Don Ahn, Won-Ki Kim. (2022). Application of Depth Resolution and Sensitivity Distribution of Electrical Resistivity Tomography to Modeling Weathered Zones and Land Creeping. The Journal of Engineering Geology, 32(1), 157-171. doi:10.9720/kseg.2022.1.157